Hideo Iizuka, Shanhui Fan
What this supports
Inference of film thickness and permittivity from force-gap dependence is investigated.
What it does not establish
No MaxwellX solver validation or verified instrument performance.
Access and verification
abstract only
Full text requires access; do not assert training data, uncertainty or experimental accuracy from abstract.
Evidence location: Publisher abstract
Countries: Japan, United States. Checked 2026-10-21. Experimental replication: not performed.
Open primary source ↗